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RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
by Jianjun Gao
The Institution of Engineering and Technology, 2010
Cloth: 978-1-891121-89-0 | eISBN: 978-1-61353-090-0
Library of Congress Classification TK7871.95.G36 2010
Dewey Decimal Classification 621.3815284

ABOUT THIS BOOK | TOC
ABOUT THIS BOOK

This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.

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