State-of-the-art analogue integrated circuit design is receiving a tremendous boost from the development and application of current-mode approaches, which are rapidly superseding traditional voltage-mode techniques. This activity is linked to important advances in integrated circuit technologies, such as the 'true' complementary bipolar process; CMOS VLSI technology, which allows realisation of high-performance mixed analogue and digital circuits; and gallium arsenide processing, which has matured to a point where it can be used effectively in high-speed analogue circuit and system design. In this book, all three technologies are represented, with key building blocks, circuit designs and applications. Many very important, but recent, techniques are presented, including switched-current techniques for high-precision filtering and A/D and D/A conversion, current-based amplifying techniques, and neural networks. Translinear principles, current mirrors, and the current conveyor are also covered. This book draws together contributions from the world's most eminent analogue IC designers to provide, for the first time, a comprehensive text devoted to this important and exciting new area of analogue electronics.

The switched-current technique is heralding a new era in analogue sampled-data signal processing. Unlike switched-capacitor circuits, switched-current circuits do not require linear floating capacitors or operational amplifiers and they are giving a renewed impetus to mixed-signal VLSI on standard digital technology. Key analogue designers from industry and academia worldwide have contributed to this first, very timely book entirely devoted to switched current analogue signal processing.

Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.