Results by title

Technology Computer Aided Design for Si, SiGe and GaAs Integrated Circuits is the first book that deals with a broad spectrum of process and device design, and modelling issues related to various semiconductor devices. This monograph attempts to bridge the gap between device modelling and process design using TCAD. Many simulation examples for different types of Si-, SiGe-, GaAs- and InP-based heterostructure MOS and bipolar transistors are given and compared with experimental data from state-of-the-art devices. Bringing various aspects of silicon heterostructures into one resource, this book also presents a comprehensive perspective of the emerging field and covers topics ranging from materials to fabrication, devices, modelling and applications.

This book describes a fast, accurate and flexible modelling methodology for PCBs. The model uses the concept of tensorial analysis of networks (TAN) based on Kron's and Kron-Branin's methods adapted for the EMC use by O. Maurice. The TAN approach is applied to the PCB SI and electromagnetic compatibility (EMC) analysis.

Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.

This book demonstrates the usefulness of the switching function in analyzing powers electronic circuits in the steady state. A procedure is suggested for the effective application of this effective application of this method for the analysis of all types of power electronic circuits. The Kirchoff's Laws and the Superposition theorem are applied by introducing the appropriate switching functions in order to derive Unified Expressions of voltage and current in switched circuits valid at all times. The exact expressions of the current in each semiconductor device in the circuit enables the circuit designer to collect all the relevant data to set the ratings of the device such as rms, average and peak values of voltage and current. The order of the voltage and current harmonics at any point in the circuit are derived with simple arithmetic. Compact expressions are derived for Sinusoidal PWM signals based on the switching function. The order, magnitude and phase of each component are derived directly from the expression with simple arithmetic. The educator has a simple way to present to his students the mechanism of operation of complex switched circuits where all the statements regarding their operation are actually presented in the model of the circuit.