edited by Tian Hong Loh
The Institution of Engineering and Technology, 2022
eISBN: 978-1-83953-279-5 | Cloth: 978-1-83953-278-8

ABOUT THIS BOOK | TOC
ABOUT THIS BOOK
Metrology has a pivotal role to ensure the vision of fifth generation (5G) and emerging wireless technologies to be realised. It is essential to develop the underpinning metrology in response to the high demand for universal, dynamic, and data-rich wireless applications. As new technologies for 5G and beyond increasingly emerge in the arena of modern wireless devices/systems, the standards bodies, industries, and research communities are facing the challenge of diverse technological requirements, and on verifying products that meet desired performance parameters.